Nanores Laboratory with state-of-the-art DualBeam electron microscopes offers a wide range of material analysis posibilities that include elemental composition tests using an EDS detector, cross-sectional examination of samples, 3D reconstruction of removed layers, preparation of TEM samples, as well as surface examination with AFM microscope.

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Nanores Laboratory offers material analysis of the interior and surface of components for aircrafts, vehicles and machines. The state-of-the-art DualBeam microscopes allow for a thorough analysis of the elemental composition, 3D reconstruction of the removed layers and performing local cross-sectioning to analyze the interior of the material, for example elements previously subjected to endurance tests.

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Nanores Laboratory with state-of-the-art DualBeam electron microscopes offers an advanced tool for developing, prototyping, reliability testing and integrated circuits control. Elemental composition and cross-sectional analysis of batteries and electrodes and fragile nano- and microstructures of displays may also be performed.

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Nanores Laboratory with state-of-the-art DualBeam electron microscopes offers, among others, studies of large cross-sections to determine surface parameters of sinters and automated analysis of the particle, grain or pore size based on SEM images.

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Nanores Laboratory with state-of-the-art DualBeam electron microscopes offers material analysis of metals and alloys including, among others, elemental analysis and determination of mechanical and surface parameters. Cross-sectional analysis and 3D reconstruction as well as electrical measurements of integrated circuits in microscale is also performed.

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Nanores Laboratory, using the state-of-the-art DualBeam electron microscopes in conjunction with photographs from a computer microtomograph, enables the modification of integrated circuits by cross-linking and signal redirection. Precise connection of electrical probes analyzing the work of the chip may also be carried out.

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Nanores Laboratory with state-of-the-art DualBeam electron microscopes offers a wide range of material analysis that include elemental composition analysis using an EDS detector, cross-sectional examination of samples, 3D reconstruction of removed layers and testing of samples previously subjected to endurance tests.

Full offer

Nanores Laboratory with state-of-the-art DualBeam electron microscopes offers the analysis of metal alloys in terms of elemental point composition and in the form of maps together with cross-sectional studies with 3D reconstruction. Testing of samples previously subjected to endurance tests to determine mechanical properties may also be performed.

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