We offer a wide range of research and analytical studies of cross-sections of samples after their 3D reconstruction. We develop innovative solutions in the field of nanotechnology, design and development of nano- and microstructures such as photonic crystals (PhC), nano- and microelectromechanical systems (NEMS/MEMS). To ensure the highest quality of our services, actively we participate in training use advanced equipment, which is included in our laboratory. Our basic equipment is microscopes FEI Dual Beam, which combine the ultra-high electron microscope and the ion microscope. Summary ion, gallium microscope (Gallium Focused Ion Beam, Ga-FIB), and xenon (Xenon Plasma Focused Ion Beam, Xe-PFIB) ensures complementarity of the two technologies – as the only company in Poland, we have a microscope DualBeam with xenon plasma beam. The perfect complement is also the atomic force microscope (AFM), working in a wide field of 100 µm.

To read more about our laboratory, to meet their basic application and parameters, we invite you to bookmark EQUIPMENT.