Dedicated services

 

 

Materials testing
 

Nanores Laboratory with state-of-the-art DualBeam electron microscopes offers a wide range of material analysis posibilities that include elemental composition tests using an EDS detector, cross-sectional examination of samples, 3D reconstruction of removed layers, preparation of TEM samples, as well as surface examination with AFM microscope.

Full offer

 

Research of components for aircraft, cars and machines
 

Nanores Laboratory offers material analysis of the interior and surface of components for aircrafts, vehicles and machines. The state-of-the-art DualBeam microscopes allow for a thorough analysis of the elemental composition, 3D reconstruction of the removed layers and performing local cross-sectioning to analyze the interior of the material, for example elements previously subjected to endurance tests.

Full offer

 

Research for the electronics industry, semiconductors and batteries
 

Nanores Laboratory with state-of-the-art DualBeam electron microscopes offers an advanced tool for developing, prototyping, reliability testing and integrated circuits control. Elemental composition and cross-sectional analysis of batteries and electrodes and fragile nano- and microstructures of displays may also be performed.

Full offer

 

Research for welds, sinters, etc.
 

Nanores Laboratory with state-of-the-art DualBeam electron microscopes offers, among others, studies of large cross-sections to determine surface parameters of sinters and automated analysis of the particle, grain or pore size based on SEM images.

Full offer

 

Research for the arms industry
 

Nanores Laboratory with state-of-the-art DualBeam electron microscopes offers material analysis of metals and alloys including, among others, elemental analysis and determination of mechanical and surface parameters. Cross-sectional analysis and 3D reconstruction as well as electrical measurements of integrated circuits in microscale is also performed.

Full offer

 

Modifications and research of integrated circuits
 

Nanores Laboratory, using the state-of-the-art DualBeam electron microscopes in conjunction with photographs from a computer microtomograph, enables the modification of integrated circuits by cross-linking and signal redirection. Precise connection of electrical probes analyzing the work of the chip may also be carried out.

Full offer

 

Turboprop and other engine tests
 

Nanores Laboratory with state-of-the-art DualBeam electron microscopes offers a wide range of material analysis that include elemental composition analysis using an EDS detector, cross-sectional examination of samples, 3D reconstruction of removed layers and testing of samples previously subjected to endurance tests.

Full offer

 

Research for the iron industry
 

Nanores Laboratory with state-of-the-art DualBeam electron microscopes offers the analysis of metal alloys in terms of elemental point composition and in the form of maps together with cross-sectional studies with 3D reconstruction. Testing of samples previously subjected to endurance tests to determine mechanical properties may also be performed.

Full offer